LS225 with F500 Plating Thickness Gauge

Product Description

Ultra small objects can be measured easily

LS225 with F500 plating thickness gauge use F500 ultra small probe, which is especially suitable for measuring coatings on small workpieces such as screws and bolts

Advanced technology ensures measurement accuracy and the ability to measure ultra thin coatings

The probe adopts digital oscillation technology and high speed ADC acquisition to ensure the high stability of the plating thickness gauge，It can measure ultra thin coatings

Conforms to national and international standards, Pass the inspection of Chinese authoritative metrology agencies

Using advanced digital probe technology, digital signal processing is done directly inside the probe. The probe is not easily interfered and provides excellent measure accuracy. The temperature change does not affect the measurement and the data remains stable to ensure very good repeatability which guarantees to pass the inspection of Chinese authoritative metrology agencies

Continuous measurement support

LS225 with F500 coating thickness gauge can continuously takes measurements which is ideal for analyzing large areas and gets one measurement result in 0.4 seconds

Multiple Calibration adjustment options including 1 to 5 points

Plating Thickness Gauge supports zero adjustment and multi point calibration, up to 5 point. It is equipped with 7 pieces of standard films of different thicknesses. The curve can be modified according to the standard film or the actual workpiece to make the measurement data more accurate

Powerful data statistics function

With data statistics function, it can store up to 9 measurement values. The plating thickness gauge can automatically calculate the maximum, minimum, average and standard deviation of the measured data

Hard probe

The hard probe ensures long term effective use of the instrument

Fixture optional, Measurement stable

Dedicated stable fixtures are provided for users to purchase, which can make the measurement more convenient and eliminate the measurement errors caused by human factors